Donaev S.B., Umirzakov B.E., Abduvayitov A.A. “Electronic Properties of CoSi2 Film in Ion Bombing by Oxygen Ions”. International Journal of Advanced Science and Technology, Vol. 29, no. 7, June 2020, pp. 9219-22, http://sersc.org/journals/index.php/IJAST/article/view/26378.