Venkata Vara Prasad Padyala, A. Vandana, E.S.S.Rajan, T.S.M.Harsha. “Vulnerability Analysis for the Authentication”. International Journal of Advanced Science and Technology, Vol. 29, no. 06, May 2020, pp. 6400 -8, http://sersc.org/journals/index.php/IJAST/article/view/20085.