G Elizabeth Rani, R Murugeswari, N Rajini. “A Quantitative Analysis of Void Detection in Scanning Electron Microscopic Images(SEM) Using Machine Learning”. International Journal of Advanced Science and Technology, Vol. 29, no. 05, May 2020, pp. 9656 -6, http://sersc.org/journals/index.php/IJAST/article/view/19428.