Maksym Iasechko, Volodymyr Larin, Dmytro Maksiuta, Dmytro Karlov, Serhii Bazilo, Ivan Sharapa, “The Method Of Determining The Probability Of Affection Of The Semiconductor Elements Under The Influence Of The Ultra-Short Duration Radio Pulses”, IJAST, vol. 29, no. 05, pp. 12903-12909, Jun. 2020.