Donaev S.B., Umirzakov B.E., Abduvayitov A.A (2020) “Electronic properties of CoSi2 film in ion bombing by oxygen ions”, International Journal of Advanced Science and Technology, 29(7), pp. 9219-9222. Available at: http://sersc.org/journals/index.php/IJAST/article/view/26378 (Accessed: 4May2024).