MAKSYM IASECHKO, VOLODYMYR LARIN, DMYTRO MAKSIUTA, DMYTRO KARLOV, SERHII BAZILO, IVAN SHARAPA. The Method Of Determining The Probability Of Affection Of The Semiconductor Elements Under The Influence Of The Ultra-Short Duration Radio Pulses. International Journal of Advanced Science and Technology, v. 29, n. 05, p. 12903-12909, 6 Jun. 2020.